STAr Technologies Announces Hybrid Automatic Test Equipment (ATE) for Parametric, Reliability and KGD Tests of 3D ICs

Hsinchu, Taiwan, R.O.C., Feb. 18, 2015 -  STAr Technologies, a leading supplier of semiconductor test systems and probe cards, is pleased to announce its new STAr Gemini Automatic Test Equipment (ATE) for 3D IC tests. STAr Gemini is one of the first hybrid ATE systems with extensive test capabilities encompassing  parametricreliability and Known Good Die (KGD) tests of 3D ICs.   

STAr Gemini's test capabilities include; process control monitoring and performance qualification of Through Silicon Via (TSV), Silicon Interposer, Copper Pillar Micro-Bumps, and Known Good Die functional tests of stacked dies. STAr Gemini's specification presents an extension to the known ATE systems in the industry by featuring an innovative architecture to address customers' needs with lowest cost-of-test while reducing time-to-market of qualified 3D ICs. 

Features include:

  • 20 instrument module slots and extensions for integrating external instruments
  • Up to 960 channels of precision DC Vis
  • 96 channels DIO modules for functional tests
  • Precision tests for pico-A currents, milli-V voltages, micro-Ωresistance, and femto-F capacitances
  • Multiplexed per-pin low-leakage switch matrix
"STAr Gemini is designed based on customer needs," stated Dr. Choon-Leogn Lou, CEO of STAr Technologies. "The system is a breakthrough in the industry with multiple capabilities spanning across parametric, reliability and functional tests. This combination provides customers the ability to tighten manufacturing process variations, improve yield and product reliability. This will definitely become an indispensable ATE for qualification of 3D ICs."

About STAr Technologies
STAr Technologies is a leading test solutions provider in the semiconductor industry today. Specializing in automated test equipment, test instruments, tests software, probe cards, test sockets and technical services, our expertise covers parametric electrical test (E-test), wafer-level and package-level reliability (WLR & PLR), mixed signal automatic test equipment (ATE), parametric/wafer sort probe cards, load boards and other consumables. STAr Technologies' headquarter is based in Hsinchu, Taiwan with subsidiaries in U.S.A., Japan, South Korea, Singapore, China and India.

To learn more about STAr Technologies please visit  www.star-quest.com



Review Article Be the first to review this article
Trimble

Photosat

Featured Video
Jobs
SYSTEMS INTEGRATOR for Palm Beach County Human Resources at West Palm Beach, FL
Solidworks Product Designer for NASCENT Technology at Charlotte, NC
Developer-Support-Implementation Engineer for EDA Careers at San Francisco Area, CA
CAD/CAM Regional Account Manager (Pacific Northwest) for Vero Software Inc. at Seattle, WA
Upcoming Events
8th International Summer School on Applied Geoinformatics for Society and Environment: Crisis and Disaster Management at University of Tehran, Kish International Campus Kish Island Iran - Apr 29 - 4, 2017
UGIC CONFERENCE 2017 at Park City Utah - May 8 - 12, 2017
C4ISR Summit 2017 at Armed Forces Officers Club Abu Dhabi United Arab Emirates - May 9 - 10, 2017
Teledyne:
GEOINT2017
CADalog.com - Countless CAD add-ons, plug-ins and more.



Internet Business Systems © 2017 Internet Business Systems, Inc.
595 Millich Dr., Suite 216, Campbell, CA 95008
+1 (408)-337-6870 — Contact Us, or visit our other sites:
AECCafe - Architectural Design and Engineering EDACafe - Electronic Design Automation TechJobsCafe - Technical Jobs and Resumes  MCADCafe - Mechanical Design and Engineering ShareCG - Share Computer Graphic (CG) Animation, 3D Art and 3D Models
  Privacy Policy