Pictometry Eco-View® Developer Earns Environmental Leadership Award

Rochester, NY, — May 20, 2010 — Pictometry International Corp., the leading provider of aerial oblique imagery and measuring software, announced today that its business partner and the developer of Pictometry Eco-View® -- LPA Systems of Rochester – has been named one of 10 Rochester companies cited for outstanding environmental leadership.

The award was presented by the Rochester Business Journal at the Environmental Leadership Symposium in Rochester last month. LPA Systems received the recognition in the Pollution Prevention category.

Pictometry Eco-View identifies potential pollution problems in run off that are invisible to the naked eye. The technology fuses the diagnostic power of near-infrared analytic from LPA Systems with high resolution aerial oblique images from Pictometry. Together, these two technologies create a remote sensing tool for assessing vegetation, watershed problems and other environmental changes. Eco-View identifies degradations in vegetative health around a septic system to detect failures earlier and is a tool that helps municipalities save money and the environment.

About LPA Systems

LPA Systems is a leader in Business Performance Management analytical solutions for Government and Commercial markets. We analyze and organize both data and imagery into concrete, actionable recommendations for the global business, geospatial and defense communities. LPA has built a number of collaborative decision-making tools for the environmental market that have received wide attention

About Pictometry

Pictometry International Corp. is a leading provider of geo-referenced, aerial image libraries and related software. Pictometry has captured nearly 130 million digital aerial images which represent more than 80 percent of the United States population and all major U.S. markets. Using its proprietary imaging process, Pictometry captures geo-referenced, high-resolution orthogonal (straight down view) and oblique (captured at an angle) imagery within which structures and land features can be measured. Pictometry customizes and markets these technologies for government and commercial applications. Pictometry’s standard oblique imagery includes second order visualization tools that do not produce authoritative or definitive information (surveying). For more information, visit www.pictometry.com.


Contact:

Tami Bacon
Public Relations Manager
E-mail: Email Contact
Tel.: (585)487-1488.




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