LogicVision to Demonstrate Desktop Silicon Debug and Characterization at DAC 2008
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LogicVision to Demonstrate Desktop Silicon Debug and Characterization at DAC 2008

Solution Enables Silicon Bring-Up without Access to Automatic Test Equipment

SAN JOSE, Calif., May 29 /PRNewswire-FirstCall/ -- LogicVision, Inc. (NASDAQ: LGVN), the leading provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, today announced that it will showcase the latest release of its Silicon Insight(TM) Desktop product at DAC 2008 using a customer performance board for a 65 nm SoC device. LogicVision will also demonstrate its SerDes BIST solution with Silicon Insight characterizing a 6.2 Gbps SerDes high-speed I/O. Silicon Insight is a key component of LogicVision's recently announced Dragonfly Test Platform(TM). Silicon Insight and the new Dragonfly Test Platform will be demonstrated at Booth 1620 at the Design Automation Conference 2008, June 9-12 in Anaheim, CA.

About Silicon Insight

Silicon Insight Desktop provides comprehensive, at-speed, SoC device-level debug and characterization using a PC laptop connected to a device performance board through a USB-to-JTAG cable interface. The latest release of Silicon Insight adds support for GPIB-based benchtop equipment, enabling design and test engineers to also perform voltage and frequency based characterization from the same laptop PC environment. Silicon Insight now makes it possible to perform full device debug, diagnostics, and characterization without the need to access or tie-up expensive automatic test equipment.

On the production floor, Silicon Insight now adds the option to perform automated production data logging, enabling product engineering teams and their foundry partners to analyze detailed failure and performance data. The production data log can be used with LogicVision's Yield Insight(TM) tool to identify systemic yield-limiting issues and help accelerate product yield ramps.

Interactive Demonstrations

LogicVision will be showcasing two interactive Silicon Insight Desktop demonstrations at this year's DAC conference. The first will highlight real- time detailed characterization of memory and logic within a customer's 65nm SOC device. Using an easy-to-use graphical interface, characterization activities such as measuring the frequency response of individual memories and determining which individual flip-flops are fed by the most-critical paths will be demonstrated. The second demonstration will show how jitter and jitter tolerance parameters of a 6.2 Gbps SerDes channel can be measured to sub- picosecond accuracy. The repeatability of these measurements will be shown as well as their strong correlation to expensive benchtop equipment.

About LogicVision Inc.

LogicVision (NASDAQ: LGVN) provides proprietary technologies for embedded test and yield learning that enable more efficient manufacturing test of complex semiconductors. LogicVision's embedded test solutions allow integrated circuit designers to embed test functionality into a semiconductor design that is used during semiconductor production test and throughout the useful life of the chip. The company's advanced Design for Test (DFT) product line, ETCreate(TM), works together with Silicon Insight(TM) applications and Yield Insight(TM) to improve profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time to market and time to yield. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com

LogicVision, ETCreate, ScanBurst, ETMemory, Silicon Insight, Yield Insight, Dragonfly Test Platform and LogicVision logos are trademarks or registered trademarks of LogicVision Inc. in the United States and other countries. All other company or product names are the registered trademarks or trademarks of their respective owners.

Web site: http://www.logicvision.com/